问题描述：
英语翻译
microcontacts
linescans
在做一篇科技类文章的翻译 遇见的这两个单词查不出来
原文如下
Traditionally,structure averaging techniques,for example bulk resistance versus temperature measurements,are used to characterize PTCR devices but,using this approach,localized property variation due to heterogeneity in the microstructure is not observed.Little work has been carried out to determine the electrical properties of individual grain boundaries,and has been conFIned to direct measurements made on coarse grained materials using “”“microcontacts”“” [5].From such experiments it has been concluded that there may be differences in the detail of the PTCR effect at different grain boundaries [4].
We can more accurately describe the development of the sample resistance with temperature by considering the evolution of a REBIC linescan across a section of the microstructure as a function of temperature.Such a sequence,spanning the gap between the two electrical contact pads along the line A-A@ on Fig.3c,is presented in Fig.4.In these linescans the signal intensity at any point along the linescan varies with the cumulative resistance along the line proFIle,as described earlier.The ordinate of each of these linescans is presented in such a way that the constant of proportionality relating signal strength to resistance is common to all the lines.This was arrived at by FIrstly normalizing the contrast range of each linescan and then scaling it by a factor equal to the inter-electrode resistance at that temperature (which was read from Fig.2).The advantage of presenting the data in this way is that a given step in the graph represents the same resistance change in each of the “”“linescans”“”.
GOOGLE翻译不出来的~
在线翻译我也会 就不用答了 实在是在线找不出来的
microcontacts
linescans
在做一篇科技类文章的翻译 遇见的这两个单词查不出来
原文如下
Traditionally,structure averaging techniques,for example bulk resistance versus temperature measurements,are used to characterize PTCR devices but,using this approach,localized property variation due to heterogeneity in the microstructure is not observed.Little work has been carried out to determine the electrical properties of individual grain boundaries,and has been conFIned to direct measurements made on coarse grained materials using “”“microcontacts”“” [5].From such experiments it has been concluded that there may be differences in the detail of the PTCR effect at different grain boundaries [4].
We can more accurately describe the development of the sample resistance with temperature by considering the evolution of a REBIC linescan across a section of the microstructure as a function of temperature.Such a sequence,spanning the gap between the two electrical contact pads along the line A-A@ on Fig.3c,is presented in Fig.4.In these linescans the signal intensity at any point along the linescan varies with the cumulative resistance along the line proFIle,as described earlier.The ordinate of each of these linescans is presented in such a way that the constant of proportionality relating signal strength to resistance is common to all the lines.This was arrived at by FIrstly normalizing the contrast range of each linescan and then scaling it by a factor equal to the inter-electrode resistance at that temperature (which was read from Fig.2).The advantage of presenting the data in this way is that a given step in the graph represents the same resistance change in each of the “”“linescans”“”.
GOOGLE翻译不出来的~
在线翻译我也会 就不用答了 实在是在线找不出来的
问题解答：
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