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(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-2010).Luminescenceexperiments were carried out by exposingthe SiO2 nanowires to X-ray irradiation using a Philips set to deliver a dose of 20 Gy·min−1.Theluminescence emission of the sample was measured using a high-sensitivity multiplexed systemwith F/2.2 optics developed.Experiments were conducted at low (25\2240 K,heating rate 6K·min−1) and high (293\2673 K,heating rate 50 K·min−1) temperatures.2 Results and discussionSEM (fig.2(a)) image reveals the presence of white product on TiSi film.Under higher resolution,the white product consists of large quantities of wire-like materials and these wires arewinding,exhibiting smooth surface and uniform diameter (ca.40\290 nm).Further HRTEM examinationshows that the nanowires are amorphous (fig.2(c)) and EDX analyses indicate that theyconsist solely of silicon and oxygen (fig.2(d)).Computer analyses exhibit that the Si\4O ratio is1\42.Therefore,they are very long amorphous SiO2 nanowires.
(ii) The white sample was divided intofour parts and separately was observed bySEM (Leo5420,10\220 keV); by TEM(H-7100,120 keV; JEM-4000,400 keV)and by HRTEM.The composition of theproduct was analyzed by energy dispersiveX-ray (EDX,JEM-2010).Luminescenceexperiments were carried out by exposingthe SiO2 nanowires to X-ray irradiation using a Philips set to deliver a dose of 20 Gy·min−1.Theluminescence emission of the sample was measured using a high-sensitivity multiplexed systemwith F/2.2 optics developed.Experiments were conducted at low (25\2240 K,heating rate 6K·min−1) and high (293\2673 K,heating rate 50 K·min−1) temperatures.2 Results and discussionSEM (fig.2(a)) image reveals the presence of white product on TiSi film.Under higher resolution,the white product consists of large quantities of wire-like materials and these wires arewinding,exhibiting smooth surface and uniform diameter (ca.40\290 nm).Further HRTEM examinationshows that the nanowires are amorphous (fig.2(c)) and EDX analyses indicate that theyconsist solely of silicon and oxygen (fig.2(d)).Computer analyses exhibit that the Si\4O ratio is1\42.Therefore,they are very long amorphous SiO2 nanowires.
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